Welcome To AURIN

News

  • The Virtual Experience December 6 – 8, 2021 Online

    The virtual experience will bring exceptional meeting content to attendees worldwide with live online, pre-recorded and on-demand scientific sessions. Virtual attendees will also be able to view live streams of select featured talks and sessions from the Boston experience during the week of Novem...
    Read more
  • 2021 MARS Fall meeting Calls for paper

    Symposium BI01-Developing an Open Source Introductory Textbook for the Materials Community The materials community is one of the few in science that does not have an open access textbook for the introduction of our discipline. This symposium is focussed on addressing this need and developing an e...
    Read more
  • The 23rd China International Optoelectronic Exposition

    The 23rd China International Optoelectronic Exposition

    CIOE 2021 (The 23rd China International Optoelectronic Exposition), as the world’s leading optoelectronic exhibition, will be held at Shenzhen World Exhibition & Convention Center on  September 1-3, 2021. More than 3,200 optoelectronic exhibitors will present the entire optoelectronic ecosys...
    Read more
  • Aurin has been granted two patents in April, 2021.

    Aurin has been granted two patents in April, 2021.

    Aurin has been granted two patents in April, 2021. Aurin solutions are used in some of the most demanding precision applications. Globally, we supply a broad array of diverse industries, and our products are used a range of products. As the technologies within these mark...
    Read more
  • What are the differences between n-type and p-type semiconductors?

    What are the differences between n-type and p-type semiconductors?

    Semiconductor refrigeration chip is widely used in our life. There are many types of semiconductor refrigeration chip in the market. Today we will explain to you the differences between n-type semiconductor and p-type semiconductor. Let’s introduce Hangzhou semiconductor refrigeration film ...
    Read more